Title: |
An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements |
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Author(s): | , , and |
Journal: | IEEE Microwave and Wireless Components Letters |
Year: | 2017 |
Month: | November |
Volume: | 27 |
Issue: | 11 |
Pages: | 1034-1036 |
DOI: | 10.1109/LMWC.2017.2750086 |