Publication single view

Title:

An Intra-laboratory Investigation of On-wafer Measurement Reproducibility at Millimeter-wave Frequencies

Author(s): Roland G. Clarke, Chong Li and Nick Ridler
Year: 2017
Month: November
Conference name: 90th ARFTG Microwave Measurement Conference (ARFTG) 2017
State: accepted
DOI: 10.1109/arftg.2017.8255866
Web URL: http://eprints.whiterose.ac.uk/125336

Back to the list view