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Title:

Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz
Author(s): Uwe Arz, S. Zinal, Thorsten Probst, Gerd Hechtfischer, Franz Josef Schmückle and Wolfgang Heinrich
Year: 2017
Month: December
Conference name: 90th ARFTG Microwave Measurement Conference (ARFTG) 2017
DOI: 10.7795/EMPIR.14IND02.CA.20190403
Web URL: https://oar.ptb.de/files/download/EMPIR.14IND02.CA.20190403.pdf

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