Title: |
Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz |
---|---|
Author(s): | , , , , and |
Year: | 2017 |
Month: | December |
Conference name: | 90th ARFTG Microwave Measurement Conference (ARFTG) 2017 |
DOI: | 10.7795/EMPIR.14IND02.CA.20190403 |
Web URL: | https://oar.ptb.de/files/download/EMPIR.14IND02.CA.20190403.pdf |