Title: |
Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction |
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Author(s): | and |
Journal: | IEEE Transactions on Microwave Theory and Techniques |
Year: | 2017 |
Month: | April |
Volume: | 65 |
Issue: | 4 |
Pages: | 9 |
DOI: | 10.1109/TMTT.2016.2609413 |