Title: |
IC calibration kits and de-embedding techniques for sub-mm-wave device characterization |
|---|---|
| Author(s): | and |
| Year: | 2017 |
| Month: | October |
| Conference name: | 2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) |
| DOI: | 10.1109/csics.2017.8240449 |