Title: |
A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model |
|---|---|
| Author(s): | , , and |
| Journal: | IEEE Transactions on Microwave Theory and Techniques |
| Year: | 2018 |
| Month: | August |
| Volume: | 66 |
| Issue: | 8 |
| Pages: | 3894-3900 |
| DOI: | 10.1109/TMTT.2018.2832052 |
| File URL: | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8385163 |