Title: |
Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices |
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Author(s): | , , , , , and |
Year: | 2016 |
Month: | December |
Conference name: | 88th ARFTG Microwave Measurement Conference, 2016 |
DOI: | 10.1109/ARFTG.2016.7839719 |