Title: |
Influence of Microwave Probes on Calibrated On-Wafer Measurements |
|---|---|
| Author(s): | , , , , , and |
| Journal: | IEEE Transactions on Microwave Theory and Techniques |
| Year: | 2019 |
| Month: | May |
| Volume: | 67 |
| Issue: | 5 |
| Pages: | 1892-1900 |
| Publisher: | IEEE |
| DOI: | 10.1109/TMTT.2019.2903400 |
| Web URL: | https://www.fbh-berlin.de/fileadmin/downloads/Publications/2019/FINAL_VERSION_repository.pdf |