Title: |
Influence of Microwave Probes on Calibrated On-Wafer Measurements |
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Author(s): | , , , , , and |
Journal: | IEEE Transactions on Microwave Theory and Techniques |
Year: | 2019 |
Month: | May |
Volume: | 67 |
Issue: | 5 |
Pages: | 1892-1900 |
Publisher: | IEEE |
DOI: | 10.1109/TMTT.2019.2903400 |
Web URL: | https://www.fbh-berlin.de/fileadmin/downloads/Publications/2019/FINAL_VERSION_repository.pdf |