2nd PlanarCal Training Day
Venue: METAS, Bern, Switzerland
Date: 14 December 2017
Time: 09:00 hours to 17:00 hours
This event is sponsored by the European Metrology Programme for Innovation and Research program (EMPIR) ‘PlanarCal - 14IND02’ Project (http://planarcal.ptb.de). The event is an informal seminar and is free to attend. The seminar features oral presentations and includes visit to some of the high-frequency electrical measurement facilities at Delft University of Technology.
TRAINING COURSE PROGRAM
| 09:15 - 09:20 | Introduction to PlanarCal | Uwe Arz Project Coordinator PTB, Germany |
| 09:20 - 10:30 | Introduction to METAS UncLib and METAS VNATools | Michael Wollensack METAS, Switzerland |
| 11:00 - 12:30 | On-wafer measurements using VNATools | Michael Wollensack METAS, Switzerland |
| 13:30 - 13:55 | Downsizing vector network analyzer measurements to nanoscale dimensions | Faisal Mubarak VSL, The Netherlands |
| 13:55 - 14:25 | Benefits and obstacles of planar on-wafer measurements at submilimeter frequencies | Roger Lozar Fraunhofer IAF, Germany |
| 14:25 - 15:10 | Reduction of parasitic effects and artifacts in MTRL calibration | Gia Ngoc Phung Ferdinand-Braun-Institut, |
| 15:40 - 16:05 | 110 GHz On-Wafer Measurement Comparison on Alumina Substrate | Thorsten Probst PTB, Germany |
| 16:05 - 16:30 | Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz | Uwe Arz PTB, Germany |
| 16:30 - 17:00 | Round table discussion | |
| 17:00 - 18:00 | METAS Lab tour |