2nd PlanarCal Project Seminar: 1st Training Course

 

Venue:             Delft University of Technology, Delft, The Netherlands

   Date:             23 June 2016

   Time:             09:00 hours to 18:00 hours

This event is sponsored by the European Metrology Programme for Innovation and Research program (EMPIR) ‘PlanarCal - 14IND02’ Project (http://planarcal.ptb.de). The event is an informal seminar and is free to attend. The seminar features oral presentations and includes visit to some of the high-frequency electrical measurement facilities at Delft University of Technology.

 

TRAINING COURSE PROGRAM

09:30 - 10:00 Microwave measurements for planar circuits and
components: State of the art and future directions   		Uwe Arz
Project Coordinator
PTB, Germany
10:00 - 10:20 Impact of piezoelectric nano-positioner displacement
accuracy on On-wafer S-parameters uncertainties 		Gilles Dambrine
Université Lille, France
10:40 - 11:00 Towards development of a broadband measurement system for extreme impedance measurements   Faisal Mubarak
VSL, The Netherlands
11:00 - 11:30 Some helpful Hints in the Use of MWS

Effects in On-Wafer-Probe Measurements 		F.J. Schmückle
 Ferdinand-Braun-Institut, Berlin
11:30 - 12:00 Repeatability in On-Wafer Measurements   Michael Wollensack
METAS, Switzerland
12:00 - 12:30 On the extraction of characteristic impedance for
transmission lines employed in mm-wave on wafer TRL
calibration   		Luca Galatro
Delft University of
Technology,
The Netherlands
13:30 - 14:00 Investigation of absorbers for on-wafer measurement
at G-band (140-220 GHz)   		Chong Li
NPL, United Kingdom
14:00 - 14:30 Modeling of Transmission Lines with Multiple Coated
Conductors   		Konstantin Lomakin
Friedrich-Alexander-
Universität,
Erlangen-Nürnberg
14:30 - 15:00 Round table discussion      
15:00 - 17:00 TU Delft Lab tour